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Measurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon

dc.contributor.authorNeves, F.
dc.contributor.authorLindote, A.
dc.contributor.authorMorozov, A.
dc.contributor.authorSolovov, V.
dc.contributor.authorSilva, C.
dc.contributor.authorBras, P.
dc.contributor.authorRodrigues, J.P.
dc.contributor.authorLopes, M.I.
dc.date.accessioned2019-02-04T12:02:19Z
dc.date.available2019-02-04T12:02:19Z
dc.date.issued2017-01-20
dc.date.updated2019-02-04T12:02:19Z
dc.description.abstractThe performance of a detector using liquid xenon (LXe) as a scintillator is strongly dependent on the collection efficiency for xenon scintillation light, which in turn is critically dependent on the reflectance of the surfaces that surround the active volume. To improve the light collection in such detectors the active volume is usually surrounded by polytetrafluoroethylene (PTFE) reflector panels, used due to its very high reflectance—even at the short wavelength of scintillation light of LXe (peaked at 178 nm). In this work, which contributed to the overall R&D effort towards the LUX-ZEPLIN (LZ) experiment, we present experimental results for the absolute reflectance measurements of three different PTFE samples (including the material used in the LUX detector) immersed in LXe for its scintillation light. The obtained results show that very high bi-hemispherical reflectance values (≥ 97%) can be achieved, enabling very low energy thresholds in liquid xenon scintillator-based detectors.
dc.description.versionPeer Reviewed
dc.identifierJINST 12 (2017) P01017; DOI 10.1088/1748-0221/12/01/P01017
dc.identifier.urihttp://dx.doi.org/10.1088/1748-0221/12/01/P01017
dc.identifier.urihttp://hdl.handle.net/10400.26/27259
dc.language.isoeng
dc.titleMeasurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon
dc.typejournal article
dspace.entity.typePublication
rcaap.rightsopenAccesspt
rcaap.typearticle

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