Picolotto Corso, MarceloPerez, Fabio LuisStefenon, Stéfano FrizzoYow, Kin-ChoongOvejero, Raúl GarcíaLEITHARDT, VALDERI2021-10-132021-10-132021-09-09http://hdl.handle.net/10400.26/37687engClassification of Contaminated Insulators Using k-Nearest Neighbors Based on Computer Visionjournal article2021-09-10cv-prod-257972210.3390/computers10090112